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Built-in reliability design of a high-frequency\ud SiC MOSFET power module

机译:内置高频\ ud可靠性设计 SiC MOSFET电源模块

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摘要

A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight.
机译:基于高频SiC MOSFET的三相2级功率模块已经过设计,仿真,组装和测试。该设计遵循内置的可靠性方法,涉及广泛的基于有限元模拟的分析,以分析在制造和运行过程中影响开关的电热机械应变和应力:进行结构模拟以识别材料,几何形状和尺寸组成部分,可以最大程度地提高可靠性。在进行硬件开发之后,进行了功能测试,结果表明该模块适用于高开关频率操作,而不会降低效率,因此可以显着减小系统级的尺寸和重量。

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